[PDF.45wh] VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
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VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
[PDF.um28] VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
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| #661684 in Books | 2006-07-21 | Original language:English | PDF # 1 | 9.25 x7.50 x2.00l,3.92 | File type: PDF | 808 pages||1 of 2 people found the following review helpful.| An Excellent Textbook|By Duncan M. Walker|I co-authored a chapter, so I am biased. But I use this book in my graduate test class. It is an excellent text for covering all of the fundamentals of integrated circuit testing - basic design-for-test, and algorithms for test generation and fault simulation.|5 of 8 people found the following review helpful.||In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these comp
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Most up-to-date coverage of design for testability.
Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
Numerous, practical examples in each chapter illustrating...
You can specify the type of files you want, for your gadget.VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) | Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.
