[PDF.34pb] High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

[PDF.pk43] High Quality Test Pattern Generation and Boolean Satisfiability

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 |  2012-01-02 |  2012-01-02 | Original language:English | PDF # 1 |  9.25 x.48 x6.10l,.67 | File type: PDF | 193 pages

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||From the Back Cover||This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

 

The aim of the techniques and meth...

You can specify the type of files you want, for your device.High Quality Test Pattern Generation and Boolean Satisfiability   |  Stephan Eggersglüß, Rolf Drechsler. I really enjoyed this book and have already told so many people about it!

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